Publication:

Analysis and Design of Monolithic Resistors with a Desired Temperature Coefficient Using Contacts

Authors:

Nima Sadeghi¹, Iman Sadeghi², Shahriar Mirabbasi¹

¹University of British Columbia, ²Google

Journal

IET Circuits, Devices Systems 2013

Abstract

A technique for implementing monolithic resistors with a desired temperature coefficient (TC) over a wide temperature range is introduced. A typical monolithic resistor consists of a core resistive layer terminated with contact layers on each end. In a typical process, there are core resistive layers that have TCs with opposite sign of that of the contacts. The authors propose to take advantage of this property and distribute a certain number of contacts across the core resistor to achieve a desired overall TC for monolithic resistors. This TC can be negative, zero or positive. The methodologies for designing such resistors are presented. As a proof-of-concept, several resistor structures have been designed and implemented in a 0.13 μm complementary metal-oxide semiconductor technology. The simulation and measurement results over the temperature range of 25-200°C confirm the validity of the proposed technique.

Resources:

Publication

IEEE Xplore Digital Library

Pages:

Content:

Pages:

Text Reference:

BibTex Reference:

@article{sadeghi-2013-analysis-and-design-of-monolithic-resistors-with-a-desired-temperature-coefficient-using-contacts,
	author = {Sadeghi, Nima and Sadeghi, Iman and Mirabbasi, Shahriar},
	title = {Analysis and Design of Monolithic Resistors with a Desired Temperature Coefficient Using Contacts},
	journal = {IET Circuits, Devices & Systems},
	volume = {7},
	number = {4},
	month = jul,
	year = {2013},
	pages = {185 -- 192},
}